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Annular dark-field imaging



Annular dark-field imaging is a method of mapping samples in a scanning transmission electron microscope (STEM). These images are formed by collecting scattered electrons with an annular dark-field detector in dedicated scanning transmission electron microscopes.

External link: CHREM: HAADF. http://www.asu.edu/clas/csss/chrem/techniques/HAADF.html. Retrieved February 23, 2006.

 
This article is licensed under the GNU Free Documentation License. It uses material from the Wikipedia article "Annular_dark-field_imaging". A list of authors is available in Wikipedia.
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