QICPIC/S | PICTOS & Co.

Proven technology meets a comprehensively enhanced system platform. With QICPIC/S, dynamic image analysis gains a new technical foundation that combines detailed particle imaging with high measurement speed and flexible options for particle characterization. A new camera generation, optimized precision objectives and enhanced image analysis capabilities provide the basis for reliable and differentiated analysis of a wide variety of particle systems.

The higher image resolution enables more detailed capture of particle contours and, in particular, supports the precise determination of particle size and shape parameters. At the same time, the larger field of view allows more particles to be captured in each image. Combined with high frame rates, this makes it possible to analyze large numbers of particles within short measurement times and establish a broad statistical basis for evaluation.

Depending on the measurement task, resolution, detection range and frame rate can be flexibly adapted to the specific requirements. QICPIC/S is therefore suitable both for the detailed analysis of fine particle structures and for measurements where high particle counts and short analysis times are key priorities. Enhanced image analysis capabilities also support the differentiated characterization of challenging particle systems, for example through improved separation of adjacent particles.

The modular system concept continues to support combination with a range of solutions for dry and wet dispersion. QUIXEL adds a new wet dispersion solution to the QICPIC/S system, further extending the options for flexible particle characterization.

The technical developments behind the new system and the practical benefits they offer will be presented for the first time at POWTECH TECHNOPHARM. Visitors can experience QICPIC/S and QUIXEL live and learn more about suitable measurement configurations for their specific applications.