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X-ray scattering techniques
X-ray scattering techniques are a family of non-destructive analytical techniques which reveal information about the crystallographic structure, chemical composition, and physical properties of materials and thin films. These techniques are based on observing the scattered intensity of an x-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength or energy.
Additional recommended knowledge
X-ray diffraction techniques
X-Ray diffraction finds the geometry or shape of a molecule using x-rays. X-ray diffraction techniques are based on the elastic scattering of x-rays from structures that have long range order. The most comprehensive description of scattering from crystals is given by the dynamical theory of diffraction.
Materials that do not have long range order may also be studied by scattering methods that rely on elastic scattering of monochromatic x-rays.
When the energy and angle of the inelastically scattered x-rays are monitored scattering techniques can be used to probe the electronic band structure of materials.
Manufacturers of x-ray diffraction equipment
|This article is licensed under the GNU Free Documentation License. It uses material from the Wikipedia article "X-ray_scattering_techniques". A list of authors is available in Wikipedia.|