Acronyms in microscopy

This list is outdated. Technological status of 1997.

Abbreviations

• AAS Atomic Absorption Spectroscopy
• ACF absorption correction factor
• ADC analog to digital converter
• AED Atomic Emission Detector
• AEM analytical electron microscope/microscopy
• AES Atomic Emission Spectroscopy
• AES Auger electron spectroscopy
• AFM atomic force microscopy
• AFS Atomic Fluorescence Spectroscopy
• APSTM Analytical Photon Scanning Tunneling Microscope
• ATW atmospheric thin window
• BSE backscattered electron
• BSED backscattered electron diffraction
• BSEI backscattered electron image/imaging
• CB coherent bremsstrahlung
• CBIM convergent-beam imaging
• CCD charge-coupled device
• CFEG cold field-emission gun
• CL condenser lens
• CL cathodoluminescence
• CRT cathode-ray tube
• CS counter-scanning
• CSI counter-scanned images
• CTEM Conventional Transmission Electron Microscopy
• DP Diffraction Pattern
• DSTEM dedicated scanning transmission electron microscopy
• EBIC electron beam-induced current
• EBSD electron backscatter diffraction
• ECD Electron Capture Detector
• EDAX Energy Dispersive Analysis of X-rays
• EDS Energy Dispersive X-ray Spectroscopy
• EDX Energy Dispersive X-ray Analysis
• EDXF Enery Dispersive X-ray Fluorescence
• EELS electron energy-loss spectrometry/spectroscopy
• EFM Electro-Force Microscopy
• EFTEM energy filtering transmission electron microscope
• EI Electron Impact
• EM Electron Microscopy
• EMMA electron microscope microanalyzer
• EMP electron microprobe
• EMPA electron microprobe analysis
• EMS electron microscopy image simulation
• EPASA Electron Probe Analysis Society of America
• EPMA electron probe microanalyzer
• EPMA electron probe micro analysis
• EPMA electron probe microanalysis
• ESCA electron spectroscopy for chemical analysis
• ESD Electron Stimulated Desorption
• ESEM Environmental Scanning Electron Microscopy
• ESI electron spectroscopic imaging
• ESR Electron Spin Resonance
• FA Fluorescence Analysis
• FCF fluorescence correction factor
• FEG field emission gun
• FEM Field Emission Electron Microscopy
• FET field effect transistor
• FFEM Freeze-Fracture Electron Microscopy
• FFT fast Fourier transform
• FIM field ion microscopy
• FOS feature-oriented scanning
• FOSPM feature-oriented scanning probe microscopy
• FSE fast secondary electron
• FWHM full width at half maximum
• FWTM full width at tenth maximum
• GB grain boundary
• GCS generalized cross section
• HPGe high purity Germanium detector
• HREM high resolution electron microscope
• HRTEM High-resolution transmission electron microscopy
• HV high vacuum
• HVEM high voltage electron microscope/microscopy
• ICP Inductively Coupled Plasma
• IR infrared spectroscopy
• IVEM intermediate voltage electron microscope/microscopy
• JEOL Japanese Electron Optics Laboratory
• KAP potassium acid phthalate
• LDE1 Layered Dispertion Element 1
• LDE2 Layered Dispertion Element 2
• LEED low-energy electron diffraction
• LEEM Low-energy electron microscopy
• LIF Lithium Fluoride
• LM light microscopy
• LOD Limit Of Detection
• MAC mass absorption coefficient
• MAS Microbeam Analysis Society
• MCA multichannel analyzer
• MDM minimum detectable mass
• MEEM Metastable Electron Emission Microscopy
• MEM Mirror Electron Microscopy
• MFM Magnetic Force Microscopy
• MLS multiple least squares fit
• MMF minimum mass fraction
• MS Mass Spectroscopy
• MTXM Magnetic Transmission X-ray Microscopy
• NAA Neutron Activation Analysis
• NIST National Institute of Standards and Technology
• nm nanometer
• NMR Nuclear Magnetic Resonance
• NPD Nitrogen-Phosphorus Detector
• OBHIC Optical Beam Heat Induced Current
• OBIC Optical Beam Induced Current
• OBIRCH Optical Beam Induced Resistance Change
• OES Optical Emission Spectroscopy
• P/B peak-to-background ratio
• PAP Pouchou and Pichoir
• PB phase boundary
• PB Particle Beam
• PEELS parallel electron energy-loss spectroscopy
• PEEM Photoemission Electron Microscopy
• PES Photoelectron Spectroscopy
• PET Pentaerythritol
• PLI Photoluminescence Imaging
• PMT photomultiplier tube
• PTMS photothermal microspectroscopy
• ppb parts per billion
• ppm parts per million
• QE quantum efficiency
• RAP rubidum acid phthalate ratemeter
• REM reflection electron microscope/microscopy
• RESOXS Resonant Soft X-ray Scattering
• RHEED reflection high-energy electron diffraction
• S/N signal-to-noise ratio
• SAD selected-area diffraction
• SAED selected area electron diffraction
• SAM scanning Auger microscopy/microprobe
• SAXS Small-Angle X-ray Scattering
• SCL Spectrally Resolved Cathodoluminescence
• SE secondary electron
• SEELS serial electron energy-loss spectrometer/spectrometry
• SEM scanning electron microscope/microscopy
• SESM scanning electron spectrometric spectroscopy
• Si(Li) Lithium drifted silicon
• SIMS secondary ion mass spectrometry/spectroscopy
• SPEEM Scanning Photoemission Electron Microscopy
• SPELEEM Spectroscopic Photoemission and Low Energy Electron Microscopy
• SPEM Scanning Photoelectron Microscopy
• SPM Scanning probe microscopy
• SRM standard reference material
• STEM scanning transmission electron microscope/microscopy
• STM scanning tunneling microscope/microscopy
• STS Scanning Tunneling Spectroscopy
• STXM Scanning Transmission X-ray Microscopy
• TAP Thallium Acid Phthalate
• TB twin boundary
• TED Transmission Electron Diffraction
• TED Thermionic Emission Detector
• TEM transmission electron microscope/microscopy
• TLE Thin Layer Electrode
• TOF-MS Time-Of-Flight Mass Spectrometry
• TXM Transmission X-ray Microscopy
• UHV ultrahigh vacuum
• UTW ultra thin window
• VDIC voltage distribution contrast
• VLM visible-light microscope/microscopy
• WDS wavelength-dispersive
• WDX wavelength dispersive X-ray spectroscopy
• XANES X-ray absorption near-edge spectroscopy
• XANES X-ray absorption near-edge structure
• XEDS X-ray energy-dispersive
• XPEEM X-ray Photoemission Electron Microscopy
• XPLEEM X-ray Photoemission and Low Energy Electron Microscopy
• XPS X-ray photoelectron spectroscopy
• XRD X-ray diffraction
• XRF X-ray Fluorescence
• ZAF atomic number, absorption, fluorescence correction

See also

• Failure analysis