Big Improvements in Laser Diffraction Help You Spot Small Differences

Best-in-class particle size distribution data from 10 nm - 3.000 µm with just 2 clicks

For big improvements that help you spot small differences.

The LS 13 320 XR offers best-in-class particle size distribution data from advanced PIDS technology, which enables high-resolution measurements and an expanded dynamic range.

Like the LS 13 320, the XR analyzer provides fast, accurate results, and helps you streamline workflows to optimize efficiency.
Some big improvements help you reliably spot small differences that can have a huge impact on your particle analysis data:

  • Direct measurement range from 10 nm – 3,000 µm
  • Automatically highlights pass/fail results for faster quality control
  • Enhanced software that simplifies method creation for standardized measurements
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