Frequency-domain STED microscopy for selective background noise suppression
Novel method suppresses background noise in STED microscopy selectively and effectively, with potential for integration into other dual-beam point-scanning techniques
08-Jul-2022 -
Nanoscopy describes the ability to see beyond the generally accepted optical limit of 200–300 nm. Stimulated emission depletion (STED) microscopy, developed by Stefan W. Hell and Jan Wichmann in 1994, and experimentally demonstrated by Hell and Thomas Klar in 1999, is a superresolution technique ...
microscopy
nanoscopy
STED microscopy
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