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K-Alpha - Monochromated, high-performance XPS spectrometer

The new surface analysis instrument, K-Alpha is a fully integrated, monochromated small-spot X-ray Photoelectron Spectrometer (XPS) system.

Product Detail
XPS is already well-established in many branches of materials characterisation and it is now an essential tool for the development of advanced bio-medical surfaces and nano-materials. State-of-the-art performance, reduced cost of ownership, increased ease of use and compact size make K-Alpha the ideal solution for many existing as well as new surface analysis application areas. K-Alpha is designed for a multi-user environment and is the first XPS tool to deliver fully automated workflow from sample entry to report generation.

K-Alpha offers three Operation Modes for Maximum Flexibility:

K-Alpha carries out both large and small feature analyses. For small feature analysis and XPS mapping, the monochromated X-ray beam may be focused into a small spot providing an ultimate lateral resolution of 30 µm. A high-flux, low-energy ion source is integral to K-Alpha for depth profiling. Low energy sputtering combined with azimuthal rotation produces profiles with excellent depth resolution.

Configuration
Microfocusing Monochromatic XPS for fast, efficient analysis. Accurate chemical state determination. Continuous spot size selection. Minimise sample damage. Easy to align. Spectrum linescans mapping capability. Advanced electron optics maximises precision and throughput. Lens: high efficiency, advanced new design. Energy analyser: high resolution. Parallel and scanned acquisition. Snapshot acquisition for rapid profiling and chemical state imaging. Rapid analysis. Excellent detectability. Accurate sample navigation for total confidence in the analysis. Confidence in analysis position. Unique lighting system. Co-axial for reflective surfaces. Diffuse for rough surfaces. Unique viewing system. Platter View for sample to sample navigation. Reflex Optics for feature alignment. Sample height setting. Analysis area annotation. ‘Click and go’ sample navigation and alignment. New ion gun provides optimum profiling conditions. Optimum depth resolution. Low energy ion beam. Sample rotation. Rastered ion beam. High current to maximise throughput. Automatic alignment and focusing provides total confidence in your results. New charge compensation system for insulator analysis. High resolution spectra. All sample types. Small and large area analysis. No user intervention required.