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Fully automated Direct Inlet Probe for Agilent MSD
MS-Screening with the mass selective detector
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After the successful introduction of the base system on the market, SIM realized the link-up of the Direct Inlet Probe for the Agilent 5973/5975 MSD to a CombiPAL autosampler. Now fully automated MS measurement for both liquid and solid samples enables high throughput for screening and online analysis.
SIM Scientific Instruments Manufacturer GmbH designed the MSD Direct Inlet Probe (DIP) to be coupled especially with an Agilent GC/MS for direct MS in EI and CI mode (DIP/MS). The system is configured so that you don’t have to uncouple the CG when switching to the DIP.
The sample at the tip of the probe will automatically proceed into the vacuum right in front of the ion source. At that point, the probe will heat up to 400°C according to the selected temperature program using heating and cooling devices.
Data acquisition and data analysis are performed in the customary manner of the Agilent MSD using the MSD ChemStation Software with all its options.
Because no hardware changes are necessary and the GC stays connected to the MSD the whole time, it is even possible to alternate DIP/MS and GC/MS analyses.
Short analysis time for mass spectra together with the CombiPAL autosampler are ideal conditions for high throughput quality control analysis as well as fast screening and online methods.
Features of the MSD Direct Inlet Probe
- direct MS measurement in EI- and CI mode of Agilent 5973/5975 MSD
- autosampler option for liquid and solid samples with microliter syringe or special designed tube gripper
- easy handling due to microprocessor controlled insertion of the sample into the vacuum of the ion source, minimizes the change of accidental venting of the mass spectrometer
- temperature programmable push rod with heating and cooling devices permits controlled direct vaporization of the sample
- alternating GC/MS and DIP/MS measurements without hardware changes
- ideal for fast screening methods and online analysis because of short analysis time and high throughput (especially in combination with autosampler)
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