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Scanning Hall probe microscope
The scanning Hall probe microscope (SHPM) is a class of scanning probe microscope which incorporates the accurate sample approach and positioning of the scanning tunnelling microscope with a semiconductor Hall sensor. This combination allows a map of the magnetic induction associated with a sample to be created. Current state of the art SHPM systems utilise 2D electron gas materials (e.g. GaAs/AlGaAs) to provide high spatial resolution (>300 nm) imaging with high magnetic field sensitivity. Unlike the magnetic force microscope the SHPM provides direct quantitative information on the magnetic state of a material. The SHPM can also image magnetic induction under applied fields up to ~1 tesla and over a wide range of temperatures (millikelvins to 300 K).
References
A. M. Chang, H.D. Hallen, L. Harriot, H.F. Hess, H. L. Los, J. Kao, R.E. Miller and T.Y. Chang, Appl. Phys. Lett. 61, 1974 (1992).
See also
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Scanning probe microscopy |
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This article is licensed under the GNU Free Documentation License. It uses material from the Wikipedia article "Scanning_Hall_probe_microscope". A list of authors is available in Wikipedia.
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