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Tabletop Microscope from Hitachi offers improved performance and a smaller footprint

Next Generation TM3000

by Uwe Binninger Analytik

The next generation TM3000 Tabletop microscope was announced beginning of February 2010 by Hitachi High-Technologies Corporation. Building on the success of its predecessor, the TM-1000, the new microscope offers significantly improved performance, including magnification up to 30,000x and better resolution, in a unit that occupies 20% less space.

With over 1000 units shipped since the launch of the TM-1000 in 2005, Hitachi’s Tabletop microscope technology has established itself in a host of applications and industries worldwide, by simplifying and facilitating observation of the microstructures of material surfaces. Used in applications ranging from R&D to quality assurance in materials, semiconductors, food products, and biotechnology, and with installations in research institutes, schools and science museums worldwide, the Tabletop microscope plays an important role in education as well as in industry.

The new TM3000 is a tabletop variable pressure scanning electron microscope, characterized by the easy operation, with a ‘one button’ auto start, auto focus and other automated onboard functions. These are all controlled through a computer with an intuitive, Windows® 7-based graphical user interface, designed for use by non-specialists. Improved electron optics has not only allowed the maximum magnification to be extended to 30,000x with improved resolution, but also provides three easily selectable modes of operation: surface (5kV), normal (15kV), analysis (high energy). 

The exceptional depth of focus, combined with the improved imaging capabilities, including shadow and topo modes, makes the TM3000 even more versatile. A larger specimen stage means that samples up to 70 mm in diameter can be examined, with an observation field of 35 x 35 mm. The inclusion of a charge-up reduction mode means that samples can be imaged without any special sample preparation like coating.  So, even insulating materials can be easily imaged.

Two optional EDS microanalysis systems are available, which offer mappings and element quantification from Boron up to Uranium. The EDS systems are also controlled by easy to learn programs.

For further Information please visit our product website, download our product brochure or get in contact with us!


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