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WITec’s exclusive new True Surface Microscopy option makes it possible to perform confocal imaging measurements parallel with and guided by large area topographic scans.
To achieve this unique capability, the WITec alpha500 microscope series can be equipped with a highly precise sensor for optical profilometry (Topographic Large Area Surface Imaging). The large area topographic coordinates from the profilometer measurement are used to perfectly trace the samples surface in either confocal or confocal Raman imaging mode. The result is an image revealing optical and/or chemical properties at the true surface of the sample, even if it is extremely rough or inclined. Sample preparation is reduced to a minimum without having to compromise the confocality of the system.
The sensor for Topographic Large Area Surface Imaging can be configured with a variety of ranges and sensitivities and interfaces directly with the WITec Control software. The integrated combination of optical profilometry and large area confocal Raman imaging is the next evolutionary step in combined microscope configurations.
The overall performance and exceptionally accurate imaging capabilities of the True Surface Microscopy option is beneficial for many applications, including the characterization of micromechanical, medical, or semiconductor devices, the mapping of functionalized surfaces, or the imaging of bio-medical or pharmaceutical material surface properties.
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